Interconnect testing
Detect opens, shorts, and stuck-at faults across scan-accessible interconnects.
Diagnostic test engineering
JTAG / Boundary Scan
Boundary-scan engines that improve diagnostic resolution, reduce development time, and accelerate guided fault isolation.
IEEE 1149.1IEEE 1149.6DTI integrationGuided probe
Capability overview
A scan-based diagnostic engine for more than simple continuity testing.
ITS provides boundary-scan (JTAG) engines integrated with the DTI platform for diagnostics and guided-probe applications. The engines support IEEE 1149.1 and 1149.6 standards and can combine interconnect, cluster, memory, and probe-driven fault isolation techniques.
By leveraging boundary scan as part of the larger test strategy, programs can reduce test-development effort while improving diagnostic resolution.
Boundary-scan coverage
Use scan access for both test coverage and faster fault isolation.
ITS boundary-scan engines integrate with the DTI platform for diagnostics and guided-probe applications while supporting IEEE 1149.1 and 1149.6.
Cluster testing
Exercise non-JTAG devices through surrounding boundary-scan chains.
Memory testing
Verify embedded memory components using scan-driven access and test sequences.
Guided probe
Accelerate fault isolation with automated probing instructions and higher diagnostic resolution.
Engineering support
Bring us the difficult test problem.
Share the platform, module, migration, modeling, or diagnostic challenge and we can help identify the right path forward.